F.J. Giessibl: search on Z-Library

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1

Advances in atomic force microscopy

Giessibl, Franz J.

Journal:

Review of Modern Physics

Year:

2003

Language:

english

File:

PDF, 3.20 MB

english, 2003

2

Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy

Giessibl, F. J.

Journal:

Year:

1995

Language:

english

File:

PDF, 1.41 MB

english, 1995

3

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Principles and Applications of the qPlus Sensor

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 1019 KB

english, 2009

4

[NanoScience and Technology] Noncontact Atomic Force Microscopy || Electrochemical Applications of Frequency Modulation Atomic Force Microscopy

Morita, Seizo, Giessibl, Franz J., Meyer, Ernst, Wiesendanger, Roland

Year:

2015

Language:

english

File:

PDF, 1.31 MB

english, 2015

5

Force Measurements on Driven Discs

M.J. Hann, J. Giessibl

Journal:

Journal of Agricultural Engineering Research

Year:

1998

Language:

english

File:

PDF, 363 KB

english, 1998

6

Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum

S. Hembacher, F.J. Giessibl, J. Mannhart

Journal:

Applied Surface Science

Year:

2002

Language:

english

File:

PDF, 122 KB

english, 2002

7

Higher-harmonic atomic force microscopy

Franz J. Giessibl

Journal:

Surface and Interface Analysis

Year:

2006

Language:

english

File:

PDF, 1.73 MB

english, 2006

8

Probing the shape of atoms in real space

Herz, M., Giessibl, F., Mannhart, J.

Journal:

Physical Review B

Year:

2003

Language:

english

File:

PDF, 615 KB

english, 2003

9

Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Giessibl, Franz J.

Journal:

Physical Review B

Year:

1997

Language:

english

File:

PDF, 150 KB

english, 1997

10

Atomic Structure Affects the Directional Dependence of Friction

Weymouth, A. J., Meuer, D., Mutombo, P., Wutscher, T., Ondracek, M., Jelinek, P., Giessibl, F. J.

Journal:

Physical Review Letters

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

11

Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy

Giessibl, F. J.

Journal:

Physical Review B

Year:

1992

Language:

english

File:

PDF, 156 KB

english, 1992

12

Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips

Wastl, Daniel S., Judmann, Michael, Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Year:

2015

Language:

english

File:

PDF, 5.82 MB

english, 2015

13

Exploring the nanoworld with atomic force microscopy

Giessibl, Franz J., Quate, Calvin F.

Journal:

Year:

2006

Language:

english

File:

PDF, 644 KB

english, 2006

14

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

Schneiderbauer, Maximilian, Wastl, Daniel, Giessibl, Franz J

Journal:

Beilstein Journal of Nanotechnology

Year:

2012

Language:

english

File:

PDF, 4.27 MB

english, 2012

15

Lateral manipulation of single iron adatoms by means of combined atomic force and scanning tunneling microscopy using CO-terminated tips

Berwanger, Julian, Huber, Ferdinand, Stilp, Fabian, Giessibl, Franz J.

Journal:

Physical Review B

Year:

2018

Language:

english

File:

PDF, 11.52 MB

english, 2018

16

Interatomic force laws that evade dynamic measurement

Sader, John E., Hughes, Barry D., Huber, Ferdinand, Giessibl, Franz J.

Journal:

Nature Nanotechnology

Year:

2018

Language:

english

File:

PDF, 1.71 MB

english, 2018

17

Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

F.J. Giessibl, G. Binnig

Journal:

Ultramicroscopy

Year:

1992

Language:

english

File:

PDF, 969 KB

english, 1992

18

Electron scattering in scanning probe microscopy experiments

Linda A. Zotti, Werner A. Hofer, Franz J. Giessibl

Journal:

Chemical Physics Letters

Year:

2006

Language:

english

File:

PDF, 442 KB

english, 2006

19

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Franz J. Giessibl, Hartmut Bielefeldt, Stefan Hembacher, Jochen Mannhart

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 110 KB

english, 1999

20

AFM's path to atomic resolution

Franz J. Giessibl

Journal:

Materials Today

Year:

2005

Language:

english

File:

PDF, 1.49 MB

english, 2005

21

Wie viel Kraft ist nötig, um ein Atom zu bewegen?

Markus Ternes, Andreas J. Heinrich, Franz J. Giessibl

Journal:

Physik in unserer Zeit

Year:

2008

Language:

german

File:

PDF, 284 KB

german, 2008

22

Atomare Ladungszustände unter dem Rasterkraftmikroskop

Leo Gross, Fabian Mohn, Gerhard Meyer, Jascha Repp, Franz J. Giessibl

Journal:

Physik in unserer Zeit

Year:

2009

Language:

german

File:

PDF, 218 KB

german, 2009

23

Imaging silicon by atomic force microscopy with crystallographically oriented tips

F.J. Giessibl, S. Hembacher, H. Bielefeldt, J. Mannhart

Journal:

Applied Physics A: Materials Science & Processing

Year:

2001

Language:

english

File:

PDF, 108 KB

english, 2001

24

Physical interpretation of frequency-modulation atomic force microscopy

Giessibl, Franz, Bielefeldt, Hartmut

Journal:

Physical Review B

Year:

2000

Language:

english

File:

PDF, 119 KB

english, 2000

25

Investigating atomic details of the CaF2(111) surface with a qPlus sensor

Giessibl, Franz J, Reichling, Michael

Journal:

Year:

2005

Language:

english

File:

PDF, 2.30 MB

english, 2005

26

Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor

Giessibl, F J, Hembacher, S, Herz, M, Schiller, Ch, Mannhart, J

Journal:

Year:

2004

Language:

english

File:

PDF, 674 KB

english, 2004

27

Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

F.J. Giessibl, H. Bielefeldt, S. Hembacher, J. Mannhart

Journal:

Annalen der Physik

Year:

2001

Language:

english

File:

PDF, 1.34 MB

english, 2001

28

Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators

Giessibl, Franz, Pielmeier, Florian, Eguchi, Toyoaki, An, Toshu, Hasegawa, Yukio

Journal:

Physical Review B

Year:

2011

Language:

english

File:

PDF, 1.04 MB

english, 2011

29

[NanoScience and Technology] Noncontact Atomic Force Microscopy Volume 99 || Method for Precise Force Measurements

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 1.72 MB

english, 2009

30

A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

Hartmut Bielefeldt, Franz J. Giessibl

Journal:

Surface Science

Year:

1999

Language:

english

File:

PDF, 146 KB

english, 1999

31

Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development

Andrei Ionescu, Elisabeth Wutscher, Eugenio Brambilla, Sibylle Schneider-Feyrer, Franz J. Giessibl, Sebastian Hahnel

Journal:

European Journal of Oral Sciences

Year:

2012

Language:

english

File:

PDF, 390 KB

english, 2012

32

Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy

Giessibl, F. J.

Journal:

Year:

2000

Language:

english

File:

PDF, 1.06 MB

english, 2000

33

Non-contact AFM

Giessibl, Franz J, Morita, Seizo

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 40 KB

english, 2012

34

Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy

Gross, L., Mohn, F., Liljeroth, P., Repp, J., Giessibl, F. J., Meyer, G.

Journal:

Year:

2009

Language:

english

File:

PDF, 313 KB

english, 2009

35

The effect of sample resistivity on Kelvin probe force microscopy

Weymouth, A. J., Giessibl, F. J.

Journal:

Applied Physics Letters

Year:

2012

Language:

english

File:

PDF, 697 KB

english, 2012

36

Dynamics of low-dimensional systems

Giessibl, Franz J, Morita, Seizo, Morita, Seizo

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 44 KB

english, 2012

37

Optimizing atomic resolution of force microscopy in ambient conditions

Wastl, Daniel S., Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Physical Review B

Year:

2013

Language:

english

File:

PDF, 2.97 MB

english, 2013

38

High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Giessibl, Franz J.

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 549 KB

english, 1998

39

[NanoScience and Technology] Noncontact Atomic Force Microscopy ||

Morita, Seizo, Giessibl, Franz J., Wiesendanger, Roland

Year:

2009

Language:

english

File:

PDF, 16.00 MB

english, 2009

40

Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers

Wutscher, T., Niebauer, J., Giessibl, F. J.

Journal:

Review of Scientific Instruments

Year:

2013

Language:

english

File:

PDF, 881 KB

english, 2013

41

The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy

Welker, Joachim, Weymouth, Alfred John, Giessibl, Franz J.

Journal:

Year:

2013

Language:

english

File:

PDF, 2.93 MB

english, 2013

42

Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air

Wastl, Daniel S., Speck, Florian, Wutscher, Elisabeth, Ostler, Markus, Seyller, Thomas, Giessibl, Franz J.

Journal:

Year:

2013

Language:

english

File:

PDF, 3.12 MB

english, 2013

43

Atomic resolution on Si(111)-(7Ã7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Giessibl, Franz J.

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 446 KB

english, 2000

44

Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy

Hofmann, Thomas, Pielmeier, Florian, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2014

Language:

english

File:

PDF, 577 KB

english, 2014

45

Seeing the Reaction

Giessibl, F. J.

Journal:

Year:

2013

Language:

english

File:

PDF, 245 KB

english, 2013

46

Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy

Pielmeier, Florian, Giessibl, Franz J.

Journal:

Physical Review Letters

Year:

2013

Language:

english

File:

PDF, 551 KB

english, 2013

47

Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy

Wastl, Daniel S., Weymouth, Alfred J., Giessibl, Franz J.

Journal:

Year:

2014

Language:

english

File:

PDF, 3.75 MB

english, 2014

48

Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite

Hembacher, S., Giessibl, F. J., Mannhart, J., Quate, C. F.

Journal:

Physical Review Letters

Year:

2005

Language:

english

File:

PDF, 774 KB

english, 2005

49

Device for in situ cleaving of hard crystals

Schmid, M., Renner, A., Giessibl, F. J.

Journal:

Review of Scientific Instruments

Year:

2006

Language:

english

File:

PDF, 518 KB

english, 2006

50

Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy

Welker, J., Giessibl, F. J.

Journal:

Year:

2012

Language:

english

File:

PDF, 937 KB

english, 2012

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